Single-photon detectors based on avalanche photodiodes (SPADs) are key elements of many modern highly sensitive optical systems. One of the bottlenecks of such detectors is an afterpulsing effect, which limits detection rate and requires an optimal hold-off time. In this paper, we propose a novel approach for statistical analysis of SPAD dark counts, and we demonstrate its usefulness for the search of the experimental condition where the afterpulsing effect can be strongly eliminated. This approach exploits a sequence of ranked time intervals between the dark counts and does not contain a complex mathematical analysis of the experimental data. We show that the approach can be efficiently applied for a small number of the dark counts, and it seems to be very beneficial for practical fast characterization of SPAD devices.